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Rochester Electronics LLC CY100E474L-7JCQ 1024 X 4 ECL SRAM
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DigiKey	CY100E474L-7JCQ	Bulk	83		14	1 - 10 - 100 $21.85 1000 $21.85 10000 $21.85	Buy Now
Infineon Technologies AG CY100E474L-7JCQ - Bulk (Alt: CY100E474L-7JCQ)
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Avnet Americas	CY100E474L-7JCQ	Bulk		4 Weeks	17	1 $22.06 10 $22.06 100 $19.75 1000 $19.75 10000 $19.75	Buy Now
Cypress Semiconductor CY100E474L-5DC
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Quest Components	CY100E474L-5DC		8			1 $20 10 $15 100 $15 1000 $15 10000 $15	Buy Now
Cypress Semiconductor CY100E474L-7JCQ CY100E474 - 1024 x 4 ECL SRAM '
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Rochester Electronics	CY100E474L-7JCQ		83		1	1 $22.06 10 $22.06 100 $20.73 1000 $18.75 10000 $18.75	Buy Now

CY100E474 Datasheets Context Search

Catalog Datasheet	MFG & Type	PDF	Document Tags
CY62256LL-PC Abstract: VIC068A-GC VIC64-NC VIC64-UMB PALCE22V10-JI PALC16L8Q PLD VME A113 CY7B923 JESD22-A113 Text: Cypress Semiconductor Product Reliability 1997 Published June, 1997 CYPRESS SEMICONDUCTOR PRODUCT RELIABILITY TABLE OF CONTENTS 1.0 OVERVIEW OF CYPRESS SEMICONDUCTOR TOTAL QUALITY MANAGEMENT SYSTEM. 1 2.0 ELECTRICAL AVERAGE OUTGOING QUALITY. 2	Original	PDF	PALCE22V10-JC FLASH-FL22D CY62256LL-PC VIC068A-GC VIC64-NC VIC64-UMB PALCE22V10-JI PALC16L8Q PLD VME A113 CY7B923 JESD22-A113
M63064 Abstract: M63041 M63002 M63080 CY7C964-NC m63032 M63058 M63065 M63069 M63057 Text: RELIABILITY MONITOR SUMMARY Description of Data Table Column Headings AAA AAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA	Original	PDF	FAMOS-P26 CY27H010-WC M63057 CY27H512-JC CY38007-NC FAMOS-VL27D M63064 M63041 M63002 M63080 CY7C964-NC m63032 M63058 M63065 M63069
CY27S03A Abstract: 15JC10 CY7C190 cy7c9101 cy7c122 die VIC068A user guide Text: Thermal Management and Component Reliability slope of the logarithmic plots is given by the activation energy of the failure mechanisms causing thermally activated wear out of the device see Figure 1 . One of the key variables determining the long-term reliability	Original	PDF	CY7C122 CY27S03A 15JC10 CY7C190 cy7c9101 cy7c122 die VIC068A user guide
CY7C9101 Abstract: CY7C510 CY7C190 cy7c189 G30-88 CY7c910 EA 9394 cy3341 CY6116 cy7c901 Text: fax id: 8511 Thermal Management Thermal Management and Component Reliability One of the key variables determining the long-term reliability of an integrated circuit is the junction temperature of the device during operation. Long-term reliability of the semiconductor chip degrades proportionally with increasing temperatures following an exponential function described by the	Original	PDF
Gunn Diode symbol Abstract: cy202 CY7C190 WSP-109BMP3 pal22V10D cy7b166 cy7c291 CY7C371 EV film cap calculation gunn diode datasheet Text: CYPRESS SEMICONDUCTOR PRODUCT RELIABILITY APPENDIX A: FAILURE RATE CALCULATION Thermal Acceleration Factors Acceleration factors AF for thermal stresses (High Temperature Operating Life, Data Retention and High Temperature Steady State Life) are calculated from the Arrhenius equation.	Original	PDF	62x10-5 Gunn Diode symbol cy202 CY7C190 WSP-109BMP3 pal22V10D cy7b166 cy7c291 CY7C371 EV film cap calculation gunn diode datasheet
10E474 Abstract: No abstract text available Text: CY10E474 CY100E474 CYPRESS SEMICONDUCTOR Features • On-chip voltage compensation for im proved noise margin • 1024 x 4-bit organization • Ultra high speed/standard power — *AA = 3.5 ns • Open emitter output for ease of memory expansion • Industry-standard pinout	OCR Scan	PDF	CY10E474 CY100E474 10KH/10K CY100E474 CY100E474L CY100E474L-- 100E474L-- 10E474
Untitled Abstract: No abstract text available Text: CY10E474 CY100E474 CYPRESS SEMICONDUCTOR • 1024 x 4 - b it organization • Ultra high speed/standard power — 1 \ \ = 3.5 ns — Iee = 275 mA • Low-power version — Iaa = 5 ns — Iee = 190 mA • Both 10KH/10K- and 100K-compatible I/O versions • 10K/10KH military version	OCR Scan	PDF	CY10E474 CY100E474 10KH/10K- 100K-compatible 10K/10KH CY10E474 CY10E474â CY10E474Lâ
A301D Abstract: No abstract text available Text: CY10E474 CY100E474 CYPRESS SEMICONDUCTOR • On-chip voltage compensation for im proved noise margin Features • 1024 x 4 ECL Static RAM 1024 x 4 -b it organization • Open em itter output for ease of memory expansion • Ultra high speed/standard power	OCR Scan	PDF	CY10E474 CY100E474 10KH/10K- 100K-compatible 10K/10KH 10KH/10K CY100E474 100E474L-5KC 100E474L-7LC A301D
c4744 Abstract: 10E474-5K 10E474 Text: CY10E474 CY100E474 CYPRESS : SEMICONDUCTOR • Features • 1024 x 4-bit organization • Ultra high speed/standard power — = 275 mA — I ce = 190 mA • Both 10KH/10K and 100K com patible I/O versions 10K/10KH M ilitary version • O n-chip voltage com pensation for	OCR Scan	PDF	CY10E474 CY100E474 10KH/10K 10K/10KH 100E474 100Kcom 10E474L-5JC 10E474L-5K 10E474I 10E474L-5 c4744 10E474-5K 10E474
ALC113 Abstract: No abstract text available Text: CY10E474 CY100E474 CYPRESS SEMICONDUCTOR • On-chip voltage compensation for im proved noise margin • Open emitter output for ease of memory expansion • Industry-standard pinout Features • 1024 x 4-bit organization • Ultra high speed/standard power	OCR Scan	PDF	CY10E474 CY100E474 10KH/10K CY100E474 CY100E474L-- ALC113
CY7C2901 Abstract: No abstract text available Text: ÌB Ìcy p ress • Table 10. Die Sizes of Cypress Devices continued P a rt N um ber Size (mil2) P a rt N um ber Size (mil2) ECL Logic CY 2909A 7968 CY100E301L 14875 CY2910A 21750 CY100E302L 14875 CY2911A 7968 CY100E422 6960 11800 CY100E474 10830 CY7C510	OCR Scan	PDF	CY100E301L CY2910A CY100E302L CY2911A CY100E422 CY100E474 CY7C510 CY100E494 CY7C516 CY10E301L CY7C2901
Untitled Abstract: No abstract text available Text: CY10E474 CY100E474 CYPRESS: SEMICONDUCTOR 1024 x 4 ECL Static RAM Features • Open em itter output for ease of memory expansion • 1024 x 4-bit organization • Industry-standard pinout • Ultra high speed/standard power — t* = 3 ns, t*cs = 2 ns — IEE = 275 mA	OCR Scan	PDF	CY10E474 CY100E474 CY10E474 10KH-/10K- BlocCY10E474-5LC CY10E474-5YC CY10E474-5KC CY10E474I
CY100E474 Abstract: CY10E474 E474 10E474-5 CY10E474L-5DC Text: CY10E474 CY100E474 IK x 4 ECL Static RAM SEMICONDUCTOR Features • On-chip voltage compensation for im proved noise margin • Open emitter output for ease of memory expansion • Industry-standard pinout • 1024 x 4-bit organization • Ultra high speed/standard power	OCR Scan	PDF	CY10E474 CY100E474 10KH/10K- 100K-compat-ible 10KA0KH CY10E474Lâ 28-Lead E474 10E474-5 CY10E474L-5DC
tc 89101 p Abstract: No abstract text available Text: CYPRESS SEMICONDUCTOR Features 1024x4 ECL Static RAM • On-chip voltage compensation for im proved noise margin • 1024 x 4 —bit organization • Ultra high speed/standard power • Open em itter output for ease o f memory expansion — Ia a = 3 -5 n s	OCR Scan	PDF	CY10E474 CY100E474 1024x4 10E474 10KH/10K 100E474 10E474L--5JC 10E474L--7JC 10E474L--7K tc 89101 p