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    3E0319 Search Results

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    Catalog Datasheet MFG & Type PDF Document Tags

    49f040

    Abstract: 6H9709 6h1026 6e9620 7G1040-1 atmel AT49F040 6H9652 8P0211C-1
    Text: Page 1 of 11 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-49F040 FLASH MEMORY RELIABILITY DATA - 150°C OPERATING LIFE TEST - 125°C OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT - 85°C/85% RELATIVE HUMIDITY OPERATING LIFE TEST


    Original     		PDF AT-49F040 AT-49F040 6H0885 6H0278 6H0279 6H1077 6H1026 7E0195 6H23C 6H1500 49f040 6H9709 6h1026 6e9620 7G1040-1 atmel AT49F040 6H9652 8P0211C-1

    EEPROM 28C256

    Abstract: 7b9729 1C0302 28C040 28C256 82307 28C256 atmel 4b23 6D9708 6C9638
    Text: PAGE 1 OF 10 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28C256 CMOS EEPROM RELIABILITY DATA -150°C DYNAMIC OPERATING LIFE TEST -CYCLE TEST -200°C RETENTION BAKE -125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)


    Original     		PDF AT-28C256 MIL-M38535 AT-28C010 AT-28C040 AT-28C256 1C0302 3E0319 3E0323 3G0338 EEPROM 28C256 7b9729 1C0302 28C040 28C256 82307 28C256 atmel 4b23 6D9708 6C9638