DSAIHSC00039550.pdf

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Partial File Text High-Reliability CMOS LSI Devices CDP1821C/3 High-Reliability CMOS 1024-Word x 1-Bit Static Random-Access Memory F or A p p lic a tio n s in A e ro s p a c e , M ilita ry , and C ritic a l i
Type Scan
ECAD Model

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