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    DSA0051025.pdf

    • AVX
    • THERMAL AND ELECTRICAL BREAKDOWN VERSUS RELIABILITY OF Ta2O5 UNDER BOTH ­ BIPOLAR BIASING CONDITIONS P. Vasina, T. Zednicek, Z. Sita, J. Sikula*, J. Pavelka* AVX Czech Republic s.r.o., Dvoákova 328
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