DSADIGA000105054.pdf

Manufacturer ON Semiconductor
Partial File Text Test Procedure for the NCP1207AADAPGEVB 01/31/2005 1.0 Diagrams 1.1 Test Configuration Figure 1. NCP1207AADAPGEVB Test Configuration. 1.2 Oscilloscope Test Points Figure 2. NCP1207AADA
Type Original
ECAD Model
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