DSA00500174.pdf

Manufacturer Vishay Semiconductors
Partial File Text Vishay Semiconductors Degradation of IREDs The diagrams in figure 103 and figure 104 are based on electrical life tests, calculated with Ea = 0.8 eV at Tj = 25°C. 20 10 IF=50mA IF=50mA Deg
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ECAD Model
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