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DSASW00421681.pdf
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On Wafer Noise Measurement Using Bipolar Transistor RF Test Structures S.D. Connor Bipolar Characterization Group, Central R&D, G.E.C. Plessey Semiconductors, Tweedale Way, Oldham, Lancs OL9 7LA,
Type
Original
ECAD Model
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User Tagged Keywords
8970B
footprint transistor
hp11612a
HP4145
HP8341B
Plessey
TRANSISTOR noise figure measurements