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DSAZIHA2X00039332.pdf
Manufacturer
GeneSiC Semiconductor
Partial File Text
IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 59, NO. 10, OCTOBER 2012 2795 Characterization of the Stability of Current Gain and Avalanche-Mode Operation of 4H-SiC BJTs Siddarth G. Sundaresan,
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Original
ECAD Model
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