DASF0018780.pdf

Manufacturer Altera
Partial File Text Chapter 3. JTAG & In-System Programmability MII51003-1.4 IEEE Std. 1149.1 (JTAG) Boundary Scan Support All MAX® II devices provide Joint Test Action Group (JTAG) boundaryscan test (BST) circ
Type Original
ECAD Model
Part Details Part pricing, stock, data attributes from Findchips.com

DASF0018780.pdf preview Download Datasheet