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DSAFRAZ0015603.pdf
Manufacturer
National Semiconductor
Partial File Text
N 0LOLWDU\$HURVSDFH $QDORJ (QJLQHHULQJ TOTAL DOSE RADIATION TEST I. INTRODUCTION Total dose radiation tests are designed to characterize changes in device performance due to total dose radi
Type
Original
ECAD Model
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H7D9751A
HM-084
LM117HVH