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DSASW00101781.pdf
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Partial File Text
Single Event Latch-Up Testing on Samsung Rev. D 4M Fast Asynchronous SRAM Joseph Benedetto, Ph.D. Craig Hafer 719-594-8319 craig.hafer@aeroflex.com Summary--Single event latch-up (SEL) testing
Type
Original
ECAD Model
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User Tagged Keywords
K6R4008C1D
K6R4008V1D
Samsung K6R4008C1D
SAMSUNG SRAM