DSAZIHA2X000110919.pdf
- Protek Devices
- SUBMODULE SCREENING TEST PLAN For Modules H1, H2 and H3 TEST CONDITION MIL-STD-750 TEST METHOD Storage TA = +175°C for 24 hours 1032 Temp Cycle -65°C to +175°C, 20 cycles,
- Original
-
Price & Stock Powered by
Findchips
