ScansU9X13141.pdf

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Partial File Text HS-6664RH Radiation Hardened September 1995 8K x 8 CMOS PROM Features 1.2 Micron Radiation Hardened Bulk CMOS Total Dose 3 x 105 RAD (Si) Transient Output Upset >5 x 108 RAD (Si)/s LET >100 MEV-cm2/mg
Type Scan
ECAD Model

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