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DSASW00222513.pdf
Manufacturer
Lattice Semiconductor
Partial File Text
MachXO2 Soft Error Detection (SED) Usage Guide November 2010 Technical Note TN1206 Introduction Soft errors occur when high-energy charged particles alter the stored charge in a memory cell i
Type
Original
ECAD Model
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1200L
2000L
4000L
7000L
error correction, verilog source
Lattice XO2
TN1206
XO2-1200
XO2-2000
XO2-4000
XO2-640
XO2-7000
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