DSAIHSC00039481.pdf

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Partial File Text . High-Reliability High-Speed CMOS Logic ICs CD54HC367/3A CD54HCT367/3A Burn-ln Test-Circuit Connections Static CD54HC/HCT367 Dynamic CD54HC/HCT367 OPEN 3,5,7,9,11, 13 (Use Static I
Type Scan
ECAD Model

DSAIHSC00039481.pdf preview Download Datasheet