DSA2IH00102797.pdf

Manufacturer Not Available
Partial File Text IV I K J I U n U L M SEMICONDUCTOR TECHNICAL DATA 1M x 40 Bit Dynamic Random Access Memory Module for Error Correction Applications The M C M 40100 and M C M 40L100 are 40M dynam ic random ac
Type Scan
ECAD Model

DSA2IH00102797.pdf preview Download Datasheet