DSA2IH0074498.pdf

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Partial File Text HiPerFASTTM IGBT with Diode IXGH 24N60AU1 Symbol V C ES V CGR V t ges V GEM ^C 25 Test Conditions T j = 2 5 °C to 1 5 0 °C T, ,, = 1 MQ J = 25° C to 150° C; R Cat Continuous Transient Tc -2
Type Scan

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