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SN74BCT8374ADW
datasheet
Manufacturer
Texas Instruments
Description
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops 24-SOIC 0 to 70
Type
Original
ECAD Model
Alternative Parts
SN74BCT8374DW
SN74BCT8374DW
SN74BCT8374ADWRE4
SN74BCT8374DWR
SN74BCT8374ADWRG4
Part Details
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