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DSADA009538.pdf
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National Semiconductor
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National Semiconductor Application Note 1313 February 2004 The SCAN90CP02 has several Design-for-Test (DfT) features intended to lower development and manufacturing test costs: · IEEE 1149.1 ·
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Original
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User Tagged Keywords
AN-1313
AN-891
IEEE 1149.6
SCAN90CP02
STA111
STA112
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