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    DSAZIHA1000192995.pdf

    • Syfer Technology
    • Surface mount capacitors 1.11 1.11 - Periodic tests conducted for IECQ-CECC and AEC-Q200 Test ref Test P1 High temperature exposure (storage) All types P2 Temperature cyc
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    DSAZIHA1000192995.pdf preview Download Datasheet

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    EN132100

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