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DSAFRAZ0015605.pdf
Manufacturer
National Semiconductor
Partial File Text
N 0LOLWDU\$HURVSDFH $QDORJ (QJLQHHULQJ TOTAL DOSE RADIATION TEST I. INTRODUCTION Total dose radiation tests are designed to characterize changes in device performance due to total dose radi
Type
Original
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LM137HVH-SMD
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