DSAZIHA1000206195.pdf

Manufacturer Texas Instruments
Partial File Text REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED 07-12-10 R. HEBER 13-03-28 C. SAFFLE Change table IIB to have a higher VIO delta limit for life test than for burn-in. âr
Type Original
ECAD Model
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