The Datasheet Archive
Please enter a valid full or partial manufacturer part number with a minimum of 3 letters or numbers
Search
DSA00101720.pdf
Manufacturer
Xilinx
Partial File Text
Single Event Effects Testing of Xilinx FPGAs Dr. Gary Lum Lockheed Martin, Sunnyvale, CA and Glen Vandenboom Xilinx, Inc. San Jose, CA Introduction Advanced Field Programmable Gate Arrays (FP
Datasheet Type
Original
ECAD Model
Part Details
Price & Stock Powered by
Findchips
DSA00101720.pdf preview
Download Datasheet
User Tagged Keywords
fpga radiation
RAM EDAC SEU
RAM SEU
Single Event Upset FPGA
SRAM Cross References
UPS control circuitry
Upset
Upsets
XQR4036XL