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    • SEMICONDUCTOR, INC. TEST VDD QO GND E 13 14 E 16 Q1 Q2 [i7 VDD [i8 FBIN GND REFCLK GND F1 FO GND m höi m m m m n Phase Detector VCO Divide Logic t4, +5, or t€ Output Butlers Gr
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    GA1087 GA1087-MC500 GA1087-MC700 MC700 SMD MARKING q2 jp
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