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SN74BCT8373ADW
datasheet
Manufacturer
Texas Instruments
Description
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70
Type
Original
ECAD Model
Alternative Parts
SN74BCT8373ADWR
SN74BCT8373ADWE4
SN74BCT8373ADWR
SN74BCT8373ADWG4
SN74BCT8373ADWRE4
Part Details
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