SN74BCT8374ADW datasheet

Manufacturer Texas Instruments
Description Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops 24-SOIC 0 to 70
Datasheet Type Original
ECAD Model
Equivalent Parts !
Always verify details of parts you are evaluating, as these parts are offered as suggestions for what you are looking for and are not guaranteed.

SN74BCT8374DWR SN74BCT8374ADWE4 SN74BCT8374ADWR SN74BCT8374ADWRE4 SN74BCT8374ADWE4
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