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DSA0027053.pdf
Manufacturer
Intersil
Partial File Text
Single Event Testing of the IS-2100ARH Half Bridge Driver Introduction The intense heavy ion environment encountered in space applications can cause a variety of transient and destructive effects
Type
Original
ECAD Model
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ac control using ir2110
ac control using ir2110 and mosfet
AN IR2110
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IR2110 equivalent
IS-2100
IS-2100ARH
IS2100ARH