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DSASW00107281.pdf
Manufacturer
Altera
Partial File Text
12. JTAG Boundary-Scan Testing in Stratix IV Devices SIV51012-3.1 The IEEE Std. 1149.1 boundary-scan test (BST) circuitry available in Stratix® IV devices provides a cost-effective and efficient
Type
Original
ECAD Model
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