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DASF0012609.pdf
Manufacturer
Lattice Semiconductor
Partial File Text
LatticeECP2/M Soft Error Detection (SED) Usage Guide September 2009 Technical Note TN1113 Introduction Soft errors occur when high-energy charged particles alter the stored charge in a memory
Type
Original
ECAD Model
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crc verilog code 16 bit
ECP2-20
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