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DSAZIHA2X000110919.pdf
Manufacturer
Protek Devices
Partial File Text
SUBMODULE SCREENING TEST PLAN For Modules H1, H2 and H3 TEST CONDITION MIL-STD-750 TEST METHOD Storage TA = +175°C for 24 hours 1032 Temp Cycle -65°C to +175°C, 20 cycles,
Type
Original
ECAD Model
Part Details
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