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    DSAZIHA2X000110919.pdf

    • Protek Devices
    • SUBMODULE SCREENING TEST PLAN For Modules H1, H2 and H3 TEST CONDITION MIL-STD-750 TEST METHOD Storage TA = +175°C for 24 hours 1032 Temp Cycle -65°C to +175°C, 20 cycles,
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