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Scans-0023094.pdf
Manufacturer
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Partial File Text
High-Reliability High-Speed CMOS Logic ICs CD54HC688/3A CD54HCT688/3A Burn-In Test-Circuit Connections (Use Static ll for /3A burn-io and Dynamic for Life Test.) Static STATIC BURN-IN 1 STATIC
Type
Scan
ECAD Model
Alternative Parts
74HC688U
MM74HC688CW
MM74HC688CW
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