DSAUTAZ0011246.pdf

Manufacturer Microchip Technology
Partial File Text Summary of Reliability Data Q4 CY2001 Dynamic Life Testing: Stress Temperature 125 degrees C Derated Temperature 55 degrees C Activation Energy 0.7 eV Acceleration Rate 78 FIT Rates at 60% confidence
Type Original
Part Details Part pricing, stock, data attributes from Findchips.com

DSAUTAZ0011246.pdf preview Download Datasheet