DSA2IH0064267.pdf

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Partial File Text 3) Septem ber 1995 Features · 3 Micron Radiation Hardened CMOS SOS · Total Dose 200K RAD (Si) · SEP Effective LET No Upsets: >100 MEV-cm2/mg · Single Event Upset (SEU) Immunity < 2 x 10'9 Errors/ B
Type Scan
ECAD Model

DSA2IH0064267.pdf preview Download Datasheet