DSADA009538.pdf by National Semiconductor

Partial File Text National Semiconductor Application Note 1313 February 2004 The SCAN90CP02 has several Design-for-Test (DfT) features intended to lower development and manufacturing test costs: · IEEE 1149.1 ·
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AN-1313 AN-891 IEEE 1149.6 SCAN90CP02 STA111 STA112

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