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    DSA00510337.pdf by Texas Instruments

    • SN54ABT8374, SN74ABT8374 SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS486 ­ JULY 1994 · · · · CLK 1Q 2Q 3Q 4Q GND 5Q 6Q 7Q 8Q TDO TMS 1 24 2 2
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