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Partial File Text 37 E ' h -a 4302371 r r is G G 2 S cl t .ö 2 ÖHAS _ High-Reliability High-Speed CMOS Logic ICs SEfllCOND SECTOR CD54HC367/3A CD54HCT367/3A nr* 52.-07 Burn-In Test-Circuit C
Datasheet Type Scan
RoHS Unknown
Pb Free Unknown
Lifecycle Unknown

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