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DSASW00122475.pdf
Manufacturer
AVX
Partial File Text
A Study of Field Crystallization in Tantalum Capacitors and its effect on DCL and Reliability T.Zednicek AVX Czech Republic, s.r.o., Dvorakova 328, 563 01 Lanskroun, Czech Republic Phone:
Datasheet Type
Original
ECAD Model
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User Tagged Keywords
batch failure test data
MIL-PRF-55365
Ta2O5
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