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DSA2H003459.pdf
Manufacturer
Aries Electronics
Partial File Text
High-Frequency Center ProbeTM Test Socket for Devices up to 55mm Square FEATURES ·For high-frequency test of CSP, BGA, DSP, LGA, SRAM, DRAM and Flash Devices ·Any device on 0.30mm pitch or larger
Datasheet Type
Original
ECAD Model
Part Details
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