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    Scans-0084931.pdf

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    • RF-Distortion in Deep-Submicron CMOS Technologies R. van Langevelde, L.F. Tiemeijer, R.J. Havens, M.J. Knitel, R.F.M. Roes, P.H. Woerlee and D.B.M. Klaassen Philips Research Laboratories, Prof. Ho
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