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DSA0051470.pdf
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Partial File Text
QC WAFER FAB Supplier: Location: Quality System: BCD Semiconductor Manufacturing Limited Shanghai, China ISO9001:2000 Starting Material/Process Materials Incoming Material Inspection
Datasheet Type
Original
ECAD Model
DSA0051470.pdf preview
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User Tagged Keywords
asl1000
INCOMING MATERIAL INSPECTION
INSPECTION
outgoing inspection
wafer incoming