Please enter a valid full or partial manufacturer part number with a minimum of 3 letters or numbers

    DSAFRAZ0021873.pdf by SANYO Electronic Components

    • (5) Reduction of failure stress The main failure mode of OS-CON is open mode primarily caused by electrostatic capacity drop at high temperature (i.e.wear out failure), besides random short circuit
    • Original
    • Unknown
    • Unknown
    • Unknown
    • Find it at Findchips.com

    DSAFRAZ0021873.pdf preview

    Price & Stock Powered by Findchips Logo
    Supplyframe Tracking Pixel