DSA00101720.pdf by Xilinx

Partial File Text Single Event Effects Testing of Xilinx FPGAs Dr. Gary Lum Lockheed Martin, Sunnyvale, CA and Glen Vandenboom Xilinx, Inc. San Jose, CA Introduction Advanced Field Programmable Gate Arrays (FP
Datasheet Type Original
RoHS Unknown
Pb Free Unknown
Lifecycle Unknown
Price & Stock Find it at Findchips.com

DSA00101720.pdf preview

Download Datasheet

User Tagged Keywords

fpga radiation RAM EDAC SEU RAM SEU Single Event Upset FPGA SRAM Cross References UPS control circuitry Upset Upsets XQR4036XL

Price & Stock Powered by