Please enter a valid full or partial manufacturer part number with a minimum of 3 letters or numbers

    Scans-0023020.pdf

    • Not Available
    • High-Reliability High-Speed CMOS Logic ICs CD54HC85/3A CD54HCT85/3A Burn-In Test-Circuit Connections (Use Static II for/3A burn-in and Dynamic for Life Test.) Static STATIC BURN-IN I STATIC BU
    • Scan

    Scans-0023020.pdf preview Download Datasheet

    User Tagged Keywords

    CD54HCT86
    Supplyframe Tracking Pixel