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    • High-Reliability High-Speed CMOS Logic ICs CD54HC273/3A CD54HCT273/3A Burn-In Test-Circuit Connections Static static burn-in i static burn-in ii open ground Vcc (6V) open ground Vcc <6V)
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    4-bit even parity checker circuit diagram CD54HC280 CD54HCT280 HCT273
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