Scans-0023073.pdf by Not Available

Partial File Text ï»¿. High-Reliability High-Speed CMOS Logic ICs CD54HC367/3A CD54HCT367/3A Burn-In Test-Circuit Connections (Use Static II for /3A burn-in and Dynamic for Life Test.) Static STATIC BURN-IN I STAT
Datasheet Type Scan
RoHS Unknown
Pb Free Unknown
Lifecycle Unknown

Scans-0023073.pdf preview Download Datasheet