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Partial File Text ï»¿SN54BCT8373, SN74BCT8373 SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES TI0222âD8373 JUNE 1990 Members of Texas Instruments SCOPEâ¢ Family of Testability Products Octal Test Integrated Circuits
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74BCT373 SN74BCT8373 ti0222

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