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DSA2IH00208776.pdf
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Partial File Text
SN54BCT8244, SN74BCT8244 SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042--TI0037--D3413, FEBRUARY 1990 Members of Texas Instruments SCOPETM Family of Testability Products Octal Test Integrated Circui
Datasheet Type
Scan
ECAD Model
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