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    Atop Technologies Inc 1P1NTS7X000001G

    IRIG-B and Serial Output module for NTS7500 - 16-pin Terminal Block
    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    NAC 1P1NTS7X000001G 9 1
    • 1 $362.5
    • 10 $362.5
    • 100 $362.5
    • 1000 $362.5
    • 10000 $362.5
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    X000001 Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    ADT-USB-PR081203001C-1

    Abstract: P200A "mini usb" P200A00 mini usb
    Text: 1 2 3 4 5 6 7 8 9 A A B B C C D D E F Item 1 2 3 4 5 6 7 Name JRS6-04FS7N1 P100345 P200A00 X000001 SB00600 SB00400 Description USB AF PVC PE 7*0. 12 L=50 L=2 PE: 30*60*0. 04 PE: 260*200*0. 04 Mini USB A5 E RoHS compliant Rev. F Description Date Approved G


    Original     		PDF JRS6-04FS7N1 P100345 P200A00 X000001 SB00600 SB00400 ADT-USB-PR081203001C-1 ADT-USB-PR081203001C-1 P200A "mini usb" P200A00 mini usb

    ADT-USB-PR081203001C

    Abstract: P200A00 P200A mini usb
    Text: 1 2 3 4 5 6 7 8 9 A A B B C C D D E F Item 1 2 3 4 5 6 7 Name JRS6-04FS7N1 P100345 P200A00 X000001 SB00600 SB00400 Description USB AF PVC PE 7*0. 12 L=50 L=2 PE: 30*60*0. 04 PE: 260*200*0. 04 Mini USB A5 E RoHS compliant Rev. F Description Date Approved G


    Original     		PDF JRS6-04FS7N1 P100345 P200A00 X000001 SB00600 SB00400 ADT-USB-PR081203001C ADT-USB-PR081203001C P200A00 P200A mini usb

    BCT8373A

    Abstract: No abstract text available
    Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE


    Original     		PDF SN54BCT8373A, SN74BCT8373A SCBS044F BCT373 SCBA004C SDYA010 SDYA012 SSYA002C, SZZU001B, SDYU001N, BCT8373A

    ATMEGA32U4

    Abstract: 7766D atmega16 assembly IC ATMEGA16 power supply schematic ATmega16 IR remote control 7766E SP12 SP13 SP14 SP15
    Text: Features • High Performance, Low Power AVR 8-Bit Microcontroller • Advanced RISC Architecture • • • • – 135 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation


    Original     		PDF 16/32K ATmega16U4/ATmega32U4) 512Bytes/1K Flash/100 7766F ATMEGA32U4 7766D atmega16 assembly IC ATMEGA16 power supply schematic ATmega16 IR remote control 7766E SP12 SP13 SP14 SP15

    BCT245

    Abstract: BCT8245A F245 SN54BCT8245A SN74BCT8245A
    Text: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE


    Original     		PDF SN54BCT8245A, SN74BCT8245A SCBS043E BCT8245A SN54BCT8245A BCT245 F245 SN54BCT8245A SN74BCT8245A

    V5050

    Abstract: BCT244 F244 SN54BCT8244A SN74BCT8244A
    Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This


    Original     		PDF SN54BCT8244A, SN74BCT8244A SCBS042E BCT8244A SN54BCT8244A 17customer V5050 BCT244 F244 SN54BCT8244A SN74BCT8244A

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


    Original     		PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE


    Original     		PDF SN54BCT8245A, SN74BCT8245A SCBS043E BCT8245A SN54BCT8245A

    mitsubishi split ac

    Abstract: 013A1
    Text: t U de nd v e er lo pm en Preliminary Specifications REV.A Mitsubishi microcomputers Specifications in this manual are tentative and subject to change. M16C / 6NT Group SINGLE-CHIP 16-BIT CMOS MICROCOMPUTER Description Description The M16C/6NT group of single-chip microcomputers are built using the high-performance silicon gate


    Original     		PDF 16-BIT M16C/6NT M16C/60 100-pin mitsubishi split ac 013A1

    ATMEL 649v

    Abstract: 6490V ATMEGA329 TWI avr adc
    Text: Features • High Performance, Low Power Atmel AVR® 8-Bit Microcontroller • Advanced RISC Architecture • • • • • • • • – 130 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation


    Original     		PDF 16MHz 32KBytes ATmega329/ATmega3290) 64KBytes ATmega649/ATmega6490) 2552K ATMEL 649v 6490V ATMEGA329 TWI avr adc

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE


    Original     		PDF SN54BCT8245A, SN74BCT8245A SCBS043E BCT245

    ATmega32H

    Abstract: PV15100 PCIE10 atmel 718 ac chopper ATMEGA64HVE2
    Text: Atmel ATmega32HVE2/ATmega64HVE2 8-bit AVR Microcontroller with Precise Analog Frontend for very Accurate Voltage and Current Measurement PRELIMINARY DATASHEET Features ● Single-package fully-integrated ● High precision analog frontend ● 17bit single-ended voltage-ADC


    Original     		PDF ATmega32HVE2/ATmega64HVE2 17bit SAEJ2602-2 ATmega32H PV15100 PCIE10 atmel 718 ac chopper ATMEGA64HVE2

    PFC 5kw

    Abstract: principle block diagram 115v 400hz power schematic diagram 10kw bldc motor speed controller 1242 qfn32 P320 AVR AT90PWM81
    Text: Features • High performance, low power Atmel AVR® 8-bit Microcontroller • Advanced RISC architecture • • • • – 131 powerful instructions - most single clock cycle execution – 32 x 8 general purpose working registers – Fully static operation


    Original     		PDF 8/16Kbytes 7734Q PFC 5kw principle block diagram 115v 400hz power schematic diagram 10kw bldc motor speed controller 1242 qfn32 P320 AVR AT90PWM81

    bct8240a

    Abstract: No abstract text available
    Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This


    Original     		PDF SN54BCT8240A, SN74BCT8240A SCBS067E BCT240 SNJ54BCT8240AFK 5962View 9174601Q3A SNJ54BCT8240AJT 9174601QLA bct8240a

    mega32u4

    Abstract: at90usb164 AT90USB324 Atmega32u4 SP10 SP11 SP12 SP13 SP14 SP15
    Text: Features • High Performance, Low Power AVR 8-Bit Microcontroller • Advanced RISC Architecture • • • • – 135 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation


    Original     		PDF

    3290

    Abstract: 3290PV rele 12V 10A RELE 12V 5 pines
    Text: Features • High Performance, Low Power AVR 8-Bit Microcontroller • Advanced RISC Architecture • • • • • • • • – 130 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation


    Original     		PDF 1149he 3290 3290PV rele 12V 10A RELE 12V 5 pines

    ATMEGA1280-16AU

    Abstract: avr 2560 atmega1280 avr 328 pc 2561 2549K-AVR-01 PJ63 TQFP64 package
    Text: Features • High Performance, Low Power AVR 8-Bit Microcontroller • Advanced RISC Architecture • • • • • • • • – 135 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation


    Original     		PDF 64K/128K/256K 2549K ATMEGA1280-16AU avr 2560 atmega1280 avr 328 pc 2561 2549K-AVR-01 PJ63 TQFP64 package

    ATMEGA324PA-PU

    Abstract: DRQFN 168T 1610t VATMEGA324PA 25810 oc 192 modulator atmel 1010
    Text: Features • High-performance, Low-power AVR 8-bit Microcontroller • Advanced RISC Architecture • • • • • – 131 Powerful Instructions – Most Single-clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation


    Original     		PDF

    mega169

    Abstract: atmega169v-8ai
    Text: Features • High Performance, Low Power AVR 8-Bit Microcontroller • Advanced RISC Architecture • • • • • • • • – 130 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation


    Original     		PDF 2514P mega169 atmega169v-8ai

    atmega169pv-8au

    Abstract: avr adc
    Text: Features • High Performance, Low Power AVR 8-Bit Microcontroller • Advanced RISC Architecture • • • • • • • • – 130 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation


    Original     		PDF 8018I atmega169pv-8au avr adc

    0262F8

    Abstract: marking TA1S INV04 p67 marking to-252
    Text: To our customers, Old Company Name in Catalogs and Other Documents On April 1st, 2010, NEC Electronics Corporation merged with Renesas Technology Corporation, and Renesas Electronics Corporation took over all the business of both companies. Therefore, although the old company name remains in this document, it is a valid


    Original     		PDF 16-BIT M16C/26 M16C/20 REU09B0001-0090Z 0262F8 marking TA1S INV04 p67 marking to-252

    DIODE marking CK 6CA

    Abstract: DIODE marking 7BA SG 6CA 6ca DIODE code 20c 7ba Diode HP5 637 409 SG 5BA MARKING CO5 sg 7ba ai cm1 100 1e8
    Text: To all our customers Regarding the change of names mentioned in the document, such as Mitsubishi Electric and Mitsubishi XX, to Renesas Technology Corp. The semiconductor operations of Hitachi and Mitsubishi Electric were transferred to Renesas Technology Corporation on April 1st 2003. These operations include microcomputer, logic, analog


    Original     		PDF M306H1SFP DIODE marking CK 6CA DIODE marking 7BA SG 6CA 6ca DIODE code 20c 7ba Diode HP5 637 409 SG 5BA MARKING CO5 sg 7ba ai cm1 100 1e8

    SN74BCT373

    Abstract: SN74BCT8373 SN74F373
    Text: SN74BCT8373 SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES SCBS471 – JUNE 1990 – REVISED JUNE 1994 • • • • • • • • Member of the Texas Instruments SCOPE  Family of Testability Products Octal Test-Integrated Circuit Functionally Equivalent to SN74F373 and


    Original     		PDF SN74BCT8373 SCBS471 SN74F373 SN74BCT373 SN74BCT8373

    SN54BCT8244A

    Abstract: SN74BCT8244A
    Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042D - FEBRUARY 1990 - REVISED APRIL 1994 Members of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to SN54/74F244 and SN54/74BCT244 in the Normal­


    OCR Scan     		PDF SN54BCT8244A, SN74BCT8244A SCBS042D SN54/74F244 SN54/74BCT244 752S5 SN54BCT8244A