testing
Abstract: No abstract text available
Text: Upscreening Options Available TEST TYPE DPA DPA chip DPA (assmb) SOLDERABILITY Group A Group B Group B (chip) Group B (assmb) Group C CSI GSI Thermal Shock Life Test (1000 hrs) Life Test (2000 hrs) Life Test (4000 hrs) LVH VTL Moisture Special 100Hr or 250Hr Life testing
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100Hr
250Hr
AS153219
testing
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74HC163
Abstract: FT54HCT161 74hct161 TI DATE CODE hct
Text: BS EN ISO 9001:2000 accreditation 1B0BBS Certificate No. RS 21690 SCD # QM6035 Source Control Drawing Upscreening/Manufacturing Specification P/N FT54HCT161 Title Page .
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QM6035
FT54HCT161
74HC163
FT54HCT161
74hct161
TI DATE CODE hct
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Force Technologies
Abstract: No abstract text available
Text: SCD#QM5333 Source Control Drawing Upscreening/Manufacturing Specification P/N FT1057AMJ8B-LT Title Page . List of Effective Pages .
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QM5333
FT1057AMJ8B-LT
Force Technologies
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QM5281
Abstract: 8682K FT1034BMH-1
Text: SCD#QM5281 Source Control Drawing Upscreening/Manufacturing Specification FT1034BMH-1.2B-LT Title Page . List of Effective Pages .
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QM5281
FT1034BMH-1
QM5281
8682K
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Untitled
Abstract: No abstract text available
Text: SCD#QM5295 Source Control Drawing Upscreening/Manufacturing Specification P/N FT5C1008-20L3MB-IS Title Page . List of Effective Pages .
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QM5295
FT5C1008-20L3MB-IS
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JM7000
Abstract: FT20C16-45EMB-X ft20C16
Text: SCD#QM5299 Source Control Drawing Upscreening/Manufacturing Specification P/N FT20C16-45EMB-X Title Page . List of Effective Pages .
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QM5299
FT20C16-45EMB-X
JM7000
FT20C16-45EMB-X
ft20C16
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FT24645S8
Abstract: FT24645S8-2 AS9001 QM6113 X24645 F064
Text: Date: 10-7-12 Source Control Drawing QM: 6113 P/N: FT24645S8-2.7I BS EN ISO 9001:2000 Accreditation AS9100 REV C Upscreening/Manufacturing Specification Document Contents 1 3 3.2 3.4 4 4.2 5.1 6.1 8 8.2 Reference Documents Source of Parts Original Part Manufacturer/Donor
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FT24645S8-2
AS9100
FT24645S8
AS9001
QM6113
X24645
F064
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PDA FOR JANTX GRADE DEVICE
Abstract: tvs diodes Avionics inspection mirror MA200KP295CVCL
Text: UPSCREENING COMMERCIAL TVS DIODES FOR AVIONICS AND ROBUST ENVIRONMENTS OR APPLICATIONS However, it is the position of Microsemi Corporation that such programs, while effective in reducing the incidence of device infant mortality in general, are inadequate when applied to
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Untitled
Abstract: No abstract text available
Text: SCD#QM5323 Source Control Drawing Upscreening/Manufacturing Specification P/N FT7C261-55WMB-CY Title Page . List of Effective Pages .
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QM5323
FT7C261-55WMB-CY
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FT1080
Abstract: No abstract text available
Text: Source Control Drawing Date: 9-08-11 QM: 5288 P/N: FT1080MJB-LT BS EN ISO 9001:2000 Accreditation AS9100 REV B SC21 Signatory Upscreening/Manufacturing Specification Document Contents 1 3 3.2 3.4 4 4.2 5.1 6.1 8 8.2 2 3.1 3.3 3.5 4.1 5 6 7 8.1 8.3 Reference Documents
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FT1080MJB-LT
AS9100
20363-5vendor
FT1080
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certificate of conformity
Abstract: ANALOG DEVICES ASSEMBLY DATE CODE
Text: SCD#QM5260 Upscreening/Manufacturing Specification FT02JMB-AD Title Page . List of Effective Pages . Change List .
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QM5260
FT02JMB-AD
certificate of conformity
ANALOG DEVICES ASSEMBLY DATE CODE
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certificate of conformity
Abstract: No abstract text available
Text: BS EN ISO 9001:2000 accreditation BS Certificate No. RS 21690 By Mike Salmon at 3:20 pm, 2/8/05 SCD # QM5336 Source Control Drawing Upscreening/Manufacturing Specification P/N FTS7M1003S40P Title Page .
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QM5336
FTS7M1003S40P
certificate of conformity
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Untitled
Abstract: No abstract text available
Text: National Semiconductor Corporation 408 721 5000 408 721 0396 1120 Kifer Road Mail Stop 10-226 Sunnyvale, CA 94086-3737 http://enhancedsolutions.national.com Tel Fax Enhanced Solutions June 26, 2001 Dear National Semiconductor Customer: National Semiconductor has become aware that some customers may be "upscreening" or "retesting"
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Untitled
Abstract: No abstract text available
Text: BS EN ISO 9001:2000 accreditation BS Certificate No. RS 21690 SCD # QM6011 Source Control Drawing Upscreening/Manufacturing Specification P/N FTS128M8X-XX-X TitlH3age .
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QM6011
FTS128M8X-XX-X
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Untitled
Abstract: No abstract text available
Text: SCD#QM5321 Source Control Drawing Upscreening/Manufacturing Specification P/N FT1012AMH/883-LT Title Page . List of Effective Pages .
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QM5321
FT1012AMH/883-LT
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FT5C2568-45CJM
Abstract: mt2568
Text: SCD#QM5272 Source Control Drawing Upscreening/Manufacturing Specification FT5C2568-45CJM Title Page . List of Effective Pages .
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QM5272
FT5C2568-45CJM
FT5C2568-45CJM
mt2568
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Untitled
Abstract: No abstract text available
Text: Date: 12-2-13 Source Control Drawing QM: 6121 P/N: FT28F160S5-70 BS EN ISO 9001:2000 Accreditation AS9100 REV C Upscreening/Manufacturing Specification Document Contents Reference Documents Source of Parts Original Part Manufacturer/Donor Supplier Screening
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FT28F160S5-70
AS9100
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ISS13
Abstract: AMD marking CODE CA94088 AM9128-20 AM9128 CD024 amd part marking AMD top marking certificate of conformity
Text: SCD#QM5266 Source Control Drawing Upscreening/Manufacturing Specification FT9128-20BJA-AMD Title Page . List of Effective Pages .
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QM5266
FT9128-20BJA-AMD
ISS13
AMD marking CODE
CA94088
AM9128-20
AM9128
CD024
amd part marking
AMD top marking
certificate of conformity
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Atmel PART marking
Abstract: No abstract text available
Text: BS EN ISO 9001:2000 accreditation BS Certificate No. RS 21690 SCD # QM5340 Source Control Drawing Upscreening/Manufacturing Specification P/N FTV750 L -XX/XXX Title Page .
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QM5340
FTV750
Atmel PART marking
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atmel part "marking"
Abstract: Atmel MARKING CODE FT27C1024-15KMB-AT 44JLCC
Text: SCD#QM5305 Source Control Drawing Upscreening/Manufacturing Specification P/N FT27C1024-15KMB-AT Title Page . List of Effective Pages .
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QM5305
FT27C1024-15KMB-AT
atmel part "marking"
Atmel MARKING CODE
FT27C1024-15KMB-AT
44JLCC
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JM7000
Abstract: static ram 2015
Text: BS EN ISO 9001:2000 accreditation AS9100 REV B Certificate No. RS 216900 SCD # QM6055 Source Control Drawing Upscreening/Manufacturing Specification P/N FT22C12DMB 1 2 3 3.1 3.2 3.3 3.4 3.5 4 4.1 4.11 5 5.1 6 6.1 7 8 8.1 8.2 8.3 Title Page .
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AS9100
QM6055
FT22C12DMB
Dec-09
JM7000
static ram 2015
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PDA FOR JANTX GRADE DEVICE
Abstract: MART100KP48CA
Text: MicroNote 129 UPSCREENING COMMERCIAL TVS DIODES FOR AVIONICS AND ROBUST ENVIRONMENTS OR APPLICATIONS However, it is the position of Microsemi Corporation that such programs, while effective in reducing the incidence of device infant mortality in general, are inadequate when applied to
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Untitled
Abstract: No abstract text available
Text: BS EN ISO 9001:2000 accreditation AS9100 REV C Certificate No. RS 21690 SCD # QM6072 Source Control Drawing Upscreening/Manufacturing Specification P/N FTM10J8MB TM 1 2 3 3.1 3.2 3.3 3.4 3.5 4 4.1 4.11 5 5.1 6 6.1 7 8 8.1 8.2 8.3 Date Title Page .
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AS9100
QM6072
FTM10J8MB
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XICOR DATE CODE
Abstract: 3817 X22C12P equivalent
Text: SCD#QM5302 Source Control Drawing Upscreening/Manufacturing Specification P/N FT22C12PM-XIC Title Page . List of Effective Pages .
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QM5302
FT22C12PM-XIC
XICOR DATE CODE
3817
X22C12P equivalent
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