5 mm White LED
Abstract: Luxeon lens Luxeon RD25 110C 245C Philips led light 1998 RD-25 Luxeon Emitter Assembly Information silicon submount mttf water distribution
Text: Reliability Datasheet RD25 LUXEON Reliability Introduction LUXEON® Power Light Sources represent a revolutionary advance over conventional small signal LED light sources. This application note summa rizes the reliability performance of the LUXEON family. The application note
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IRFP460Z
Abstract: IRF3205 application IRF3205 equivalent power MOSFET IRFP460z irfp4004 IRF3808 equivalent irfz44v equivalent IRF1405 equivalent IRLL014N IRF3205
Text: Switch and I/O Reliability Report March, 2003 International Rectifier Table Of Contents 1.0 Introduction 2.0 Environmental Stress And Failure Modes 3.0 The Matrix Qualification Philosophy 4.0 Summary Of Long Term Reliability Test 4.1 Transistors 4.1.1 HTRB
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O-220
IRFP460Z
IRF3205 application
IRF3205 equivalent
power MOSFET IRFP460z
irfp4004
IRF3808 equivalent
irfz44v equivalent
IRF1405 equivalent
IRLL014N
IRF3205
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EM4222
Abstract: soi switches 2003 Linear SOI switch body RF 2003 tinella RF low power hearing aids car Speed Sensor using RFID UHF RFID passive tag CMOS microwave distance sensors silicon on insulator FDSOI TECHNOLOGY
Text: OCTOBER 2003 RFDESIGN RF AND MICROWAVE TECHNOLOGY FOR DESIGN ENGINEERS Why all the buzz about SOI? Silicon-on-insulator technology offers solutions to the higher-performance and lower-power dilemma Digital Systems: New two-antenna handset technology improves CDMA
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b517
Abstract: UCL 2003 lumileds B317 HWFR-B317 Lumileds Lighting B417 DS42 HWFR-B417 HWFR-B517
Text: HWFR B317 HWFR B417 HWFR B517 Lumileds P4 Series LED Chips Benefits Technical Data DS42 • Fewer LEDs Required • Lowers Lighting System Cost The P4 series chips are a transparent substrate AlInGaP chip delivering high flux performance. Features • High Luminous Flux
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HWFR-B317
HWFR-B417
HWFR-B517
b517
UCL 2003
lumileds
B317
HWFR-B317
Lumileds Lighting
B417
DS42
HWFR-B417
HWFR-B517
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HWFR-B310
Abstract: HWFR-B410 b310 diode B310 B410 B510 DS31 HWFR-B510 lumileds
Text: HWFR B310 HWFR B410 HWFR B510 Lumileds P3 Series TS AlInGaP Chips Technical Data DS31 P3 Series transperent substrate AlInGaP chips deliver high flux performance. Benefits Outline Drawings • Fewer LEDs Required • Lowers Lighting System Cost Al Bond Pad
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HWFR-B310
HWFR-B410
HWFR-B510
HWFR-B310
HWFR-B410
b310 diode
B310
B410
B510
DS31
HWFR-B510
lumileds
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max785cai
Abstract: MAX6809 MAX232CPE MAX232CPE application sheet MAX232ACPE MAX232AEPE MAX691ACPE T 9722 MAX232ECPE MAX233 application notes
Text: January 1999 Product Reliability Report This report presents the product reliability data for Maxim’s analog products. The data was acquired from extensive reliability stress testing performed in 1997/1998. It is separated into seven fabrication processes: 1
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max785cai
Abstract: MAX232A SO-16 MAX232CPE application sheet MAX232CPE MAX232AEPE MAX785 MAX232ACPE MAX241CWI LH101 MAX724CCK
Text: January 1999 Product Reliability Report This report presents the product reliability data for Maxim’s analog products. The data was acquired from extensive reliability stress testing performed in 1997/1998. It is separated into seven fabrication processes: 1
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MAX6754-MAX6762
Abstract: No abstract text available
Text: MAX6762 RELIABILITY REPORT FOR MAX6762TARAD3+ PLASTIC ENCAPSULATED DEVICES May 25, 2011 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Sokhom Chum Quality Assurance Reliability Engineer Maxim Integrated Products. All rights reserved.
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MAX6762
MAX6762TARAD3+
MAX6762TARAD3
/-1000V
/-250mA.
S0000Q081A,
IQ0000008C,
MAX6754-MAX6762
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Untitled
Abstract: No abstract text available
Text: MAX1031 RELIABILITY REPORT FOR MAX1031BETI+T PLASTIC ENCAPSULATED DEVICES February 24, 2011 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Sokhom Chum Quality Assurance Reliability Engineer Maxim Integrated Products. All rights reserved.
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MAX1031
MAX1031BETI
MAX1031BETI+
RelMP1BQ001B
AC19-1
/-2000V
/-250mA.
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quality and reliability report
Abstract: No abstract text available
Text: MAX1231 RELIABILITY REPORT FOR MAX1231BEEG+ PLASTIC ENCAPSULATED DEVICES July 8, 2011 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Sokhom Chum Quality Assurance Reliability Engineer Maxim Integrated Products. All rights reserved.
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MAX1231
MAX1231BEEG+
MAX1231
SMP1DA052W
AC19-1
/-2500V
JESD22-A114.
/-250mA
JESD78.
quality and reliability report
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MAX1472AKA
Abstract: No abstract text available
Text: MAX1472 RELIABILITY REPORT FOR MAX1472AKA+ PLASTIC ENCAPSULATED DEVICES October 1, 2009 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Ken Wendel Quality Assurance Director, Reliability Engineering Maxim Integrated Products. All rights reserved.
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MAX1472
MAX1472AKA+
MAX1472
96hrs.
C/150
MAX1472AKA
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Untitled
Abstract: No abstract text available
Text: 134 Marbledale Road, Tuckahoe, NY 10707 Tel: 914914-793 793-0700 Fax: 914 914-793 793-4527 www.jonard.com APPENDIX 6b SUMMARY REPORT FOR SIX-SIGMA PILOT STUDY MAGNAMOLE CABLE THREADER April 2007 CONFIDENTIAL SUMMARY OF METRICS SUMMARY OF DMAIC STEPS DATA ANALYSIS
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914-793914-793www
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Untitled
Abstract: No abstract text available
Text: MAX1574ETB+ RELIABILITY REPORT FOR MAX1574ETB+ PLASTIC ENCAPSULATED DEVICES April 5, 2009 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Ken Wendel Quality Assurance Director, Reliability Engineering Maxim Integrated Products. All rights reserved.
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MAX1574ETB+
Device50
1000hrs.
C/150
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au335
Abstract: No abstract text available
Text: RELIABILITY REPORT FOR MAX9718xxBL+ CHIP SCALE PACKAGE November 5, 2009 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Ken Wendel Quality Assurance Director, Reliability Engineering Maxim Integrated Products. All rights reserved.
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MAX9718xxBL+
96hrs.
C/125
au335
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MAX3070E
Abstract: MAX3079 MAX3072E MAX3078E
Text: MAX3076E RELIABILITY REPORT FOR MAX3076EASD+ PLASTIC ENCAPSULATED DEVICES August 18, 2011 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Sokhom Chum Quality Assurance Reliability Engineer Maxim Integrated Products. All rights reserved.
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MAX3076E
MAX3076EASD+
SAP6CQ001A
RT52-6
/-1000V
/-250mA.
MAX3070E
MAX3079
MAX3072E
MAX3078E
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MAX7310EUE
Abstract: 16-Pin TSSOP theta Jc value
Text: RELIABILITY REPORT FOR MAX7310EUE+ PLASTIC ENCAPSULATED DEVICES October 23, 2009 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Ken Wendel Quality Assurance Director, Reliability Engineering Maxim Integrated Products. All rights reserved.
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MAX7310EUE+
96hrs.
C/150
MAX7310EUE
16-Pin TSSOP theta Jc value
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MAX3059
Abstract: rt72
Text: MAX3058 RELIABILITY REPORT FOR MAX3058ASA+ PLASTIC ENCAPSULATED DEVICES April 27, 2011 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Sokhom Chum Quality Assurance Reliability Engineer Maxim Integrated Products. All rights reserved.
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MAX3058
MAX3058ASA+
InforT72
/-2500V
/-250mA.
SGS0CQ003B,
MAX3059
rt72
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16-Pin TSSOP theta Jc value
Abstract: No abstract text available
Text: MAX4063 RELIABILITY REPORT FOR MAX4063EUD+T / MAX4063ETE+T PLASTIC ENCAPSULATED DEVICES January 18, 2011 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Richard Aburano Quality Assurance Manager, Reliability Operations Maxim Integrated Products. All rights reserved.
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MAX4063
MAX4063EUD
MAX4063ETE
250mA.
16-Pin TSSOP theta Jc value
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Untitled
Abstract: No abstract text available
Text: MAX1123 RELIABILITY REPORT FOR MAX1123EGK+ PLASTIC ENCAPSULATED DEVICES September 12, 2011 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Sokhom Chum Quality Assurance Reliability Engineer Maxim Integrated Products. All rights reserved.
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MAX1123
MAX1123EGK+
QFL0EQ001D
/-1500V
/-250mA.
QFL0EQ001C,
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mil-std-883 2015
Abstract: mil-std-883* 2015 LV500 BOX BUILD FABRICATION PROCESS INCOMING RAW MATERIAL INSPECTION method for Total organic carbon analyzer INCOMING RAW MATERIAL INSPECTION procedure INCOMING RAW MATERIAL INSPECTION report
Text: Littelfuse Quality and Reliability 11 Transient Voltage Suppression PAGE Littelfuse Quality . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11-3
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Abstract: No abstract text available
Text: MAX1168 RELIABILITY REPORT FOR MAX1168CCEG+ PLASTIC ENCAPSULATED DEVICES October 1, 2009 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Ken Wendel Quality Assurance Director, Reliability Engineering Maxim Integrated Products. All rights reserved.
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MAX1168
MAX1168CCEG+
MAX1168
96hrs.
C/150
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Untitled
Abstract: No abstract text available
Text: MAX6752 RELIABILITY REPORT FOR MAX6752 PLASTIC ENCAPSULATED DEVICES March 10, 2010 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Richard Aburano Quality Assurance Manager, Reliability Operations Maxim Integrated Products. All rights reserved.
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MAX6752
MAX6752
250mA.
MAX6752KA46+
96hrs.
C/150
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INCOMING RAW MATERIAL INSPECTION form
Abstract: IC 34992 ucl 11
Text: QUALITY ASSURANCE and RELIABILITY PROGRAM 1. Introduction Samsung utilizes rigorous qualification and reliability programs to monitor the integrity of its devices. All industry' standard and various non-standard stresses are run. Testing is done not only to collect data, but also to detect
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FTG-12
Abstract: INCOMING RAW MATERIAL FILM INSPECTION procedure ADE-6 Sample form for INCOMING Inspection of RAW MATERIAL mosfet 1500v MTBF UCL 2003 INCOMING RAW MATERIAL INSPECTION method
Text: QUALITY ASSURANCE and RELIABILITY PROGRAM 1. Introduction Samsung utilizes rigorous qualification and reliability programs to m onitor the integrity o f its devices. All industry standard and various non-standard stresses are run. Testing is done not only to collect data, but also to detect
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